A Reduced Order Model for Epitaxial Growth
نویسندگان
چکیده
We formulate a reduced order model for multi-layer, epitaxial growth of a thin film. The model describes layer-by-layer growth using three bulk (i.e. scalar) quantities per layer: average coverage ψ, average island number density n and average adatom density ρ for each layer. The model relies on simplifying assumptions on the geometry of the islands, as well as several approximations for the physical growth processes. We present analytical results on scaling and the relation to rate equations, as well as numerical results comparing this bulk model to a solid-on-solid (SOS) model and an island dynamics model.
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